Pernpeintner, M.; Holländer, R.B.; Seitner, M.J.; Weig, E.M.; Gross, R.; Goennenwein, S.T.B.; Huebl, H.
A versatile platform for magnetostriction measurements in thin films
Journal of Applied Physics 119, 093901 2016-03
2016
Mar

Seitner, M.J.; Ribeiro, H.; Kölbl, J.; Faust, T.; Kotthaus, J.P.; Weig, E.M.
Classical Stückelberg interferometry of a nanomechanical two-mode system
Phys. Rev. B 94, 245406 2016-12
2016
Dec

Volz, S.; Ordonez-Miranda, J.; Shchepetov, A.; Prunnila, M.; Ahopelto, J.; Pezeril, T.; Vaudel, G.; Gusev, V.; Ruello, P.; Weig, E. M.; Schubert, M.; Hettich, M.; Grossman, M.; Dekorsy, T.; Alzina, F.; Graczykowski, B.; Chavez-Angel, E.; Reparaz, J.S.; Wagner, M.R.; Sotomayor-Torres, C.M.; Xiong, S.; Neogi, S.; Donadio, D.
Nanophononics: state of the art and perspectives
The European Physical Journal B volume 89, Article number: 15 2016-01
2016
Jan