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Titel:

Signatures of two-level defects in the temperature-dependent damping of nanomechanical silicon nitride resonators

Dokumenttyp:
Zeitschriftenaufsatz
Autor(en):
Faust, T.; Rieger, Seitner, M.J.; J.; Kotthaus, J.P.; Weig, E.M.
Abstract:
The damping rates of high quality factor nanomechanical resonators are well beyond intrinsic limits. Here,we explore the underlying microscopic loss mechanisms by investigating the temperature-dependent dampingof the fundamental and third harmonic transverse flexural mode of a doubly clamped silicon nitride string. Itexhibits characteristic maxima reminiscent of two-level defects typical for amorphous materials. Coupling tothose defects relaxes the momentum selection rules, allowing energy trans...     »
Dewey Dezimalklassifikation:
010 Bibliografien
Zeitschriftentitel:
PHYSICAL REVIEW B89, 100102(R) 2014-03
Jahr:
2014
Jahr / Monat:
2014-03
Quartal:
1. Quartal
Monat:
Mar
Sprache:
en
Volltext / DOI:
doi:10.1103/PhysRevB.89.100102
WWW:
https://journals.aps.org/prb/abstract/10.1103/PhysRevB.89.100102
Verlag / Institution:
American Physical Society APS
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