Anetsberger, G.; Verlot, P.; Gavartin, E.; Arcizet, O.; Unterreithmeier, Q.P.; Weig, E.M.; Gorodetsky, M.L.; Kotthaus, J.P.; Kippenberg, T.J.
Measuring nanomechanical motion with an imprecision below that at the standard quantum limit
CLEO: - Laser Science to Photonic Applications
Baltimore MD, USA, 01-06 May 2011-05
IEEE Digital Explorer
2011