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- Title:
Modeling and simulation of an active restoring mechanism for high reliability switches in RF-MEMS technology
- Document type:
- Konferenzbeitrag
- Contribution type:
- Vortrag / Präsentation
- Author(s):
- Künzig, T.; Schrag, G.; Iannacci, J.
- Book / Congress title:
- Proceedings of the 23rd European Sysmposium on Reliability of Electron Devices, Failure Physics and Analysis
- Congress (additional information):
- ESREF2012, October 1-5, Cagliari, Italy
- Publisher:
- Elsevier
- Publisher address:
- Amsterdam
- Year:
- 2012
- Reviewed:
- ja
- Language:
- en
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