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- Title:
Sensitivity Analysis Based Analytical Evaluation of Aging Degradation in Linear Circuits
- Author(s):
- More, Shailesh; Chouard, Florian; Schmitt-Landsiedel, Doris; Fulde, Michael
- Book / Congress title:
- European Solid-State Circuits Conference
- Year:
- 2010
- Month:
- sep
- Bookseries title:
- ESSCIRC Fringe
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