Login
- Titel:
Sensitivity Analysis Based Analytical Evaluation of Aging Degradation in Linear Circuits
- Autor(en):
- More, Shailesh; Chouard, Florian; Schmitt-Landsiedel, Doris; Fulde, Michael
- Kongress- / Buchtitel:
- European Solid-State Circuits Conference
- Jahr:
- 2010
- Monat:
- sep
- Serientitel:
- ESSCIRC Fringe
BibTeX