Virtual Double Pulse Tests to Reduce Measuring Time and Effort in Semiconductor Loss Modeling

Title:: Virtual Double Pulse Tests to Reduce Measuring Time and Effort in Semiconductor Loss Modeling
Document type:: Konferenzbeitrag
Author(s):: Goldmann, Daniel; Schramm, Simon; Galek, Marek; Herzog, Hans-Georg
Pages contribution:: 1–7
Book / Congress title:: PCIM Europe 2019; International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
Publisher:: VDE Verlag
Publisher address:: Berlin, Germany
Year:: 2019
Year / month:: 2019-05
Month:: May
Print-ISBN:: 978-3-8007-4938-6
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