Virtual Double Pulse Tests to Reduce Measuring Time and Effort in Semiconductor Loss Modeling

Goldmann, Daniel; Schramm, Simon; Galek, Marek; Herzog, Hans-Georg

Titel:: Virtual Double Pulse Tests to Reduce Measuring Time and Effort in Semiconductor Loss Modeling
Dokumenttyp:: Konferenzbeitrag
Autor(en):: Goldmann, Daniel; Schramm, Simon; Galek, Marek; Herzog, Hans-Georg
Seitenangaben Beitrag:: 1–7
Kongress- / Buchtitel:: PCIM Europe 2019; International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
Verlag / Institution:: VDE Verlag
Verlagsort:: Berlin, Germany
Jahr:: 2019
Jahr / Monat:: 2019-05
Monat:: May
Print-ISBN:: 978-3-8007-4938-6
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