Micro-structure orientation extraction for Anisotropic X-Ray Dark-Field Tomography

In modern grating based X-ray imaging the dark- field signal correlates to ultra-small angle scattering caused by microstructures within the measured sample. Previously this anisotropic information has been reconstructed using X- ray tensor tomography (XTT) with the restriction of a single orientation per position/voxel. To overcome this limitation, the method of Anisotropic X-ray Dark-field Tomography (AXDT) has been introduced recently. In contrast to XTT, this new method is capable of reconstructing a complete spherical representation of the scattering in a specific position, which is strongest orthogonally to the micro-structures. In this work we are going to present a method to extract the orientation of these micro-structures.     «

In modern grating based X-ray imaging the dark- field signal correlates to ultra-small angle scattering caused by microstructures within the measured sample. Previously this anisotropic information has been reconstructed using X- ray tensor tomography (XTT) with the restriction of a single orientation per position/voxel. To overcome this limitation, the method of Anisotropic X-ray Dark-field Tomography (AXDT) has been introduced recently. In contrast to XTT, this new method is capable of reconst...     »