Patzauer, Maximilian;Hueck, Richard;Tosolini, Anton;Schönleber, Konrad;Krischer, KatharinaAutonomous Oscillations and Pattern Formation with Zero External Resistance during Silicon ElectrodissolutionElectrochimica Acta2017246315-321
Helml, Wolfram;Grguraš, Ivanka;Juranić, Pavle;Düsterer, Stefan;Mazza, Tommaso;Maier, Andreas;Hartmann, Nick;Ilchen, Markus;Hartmann, Gregor;Patthey, Luc;Callegari, Carlo;Costello, John;Meyer, Michael;Coffee, Ryan;Cavalieri, Adrian;Kienberger, ReinhardUltrashort Free-Electron Laser X-ray PulsesApplied Sciences201779915
Bischoff, Felix;Auwärter, Willi;Barth, Johannes V.;Schiffrin, Agustin;Fuhrer, Michael;Weber, BentNanoscale Phase Engineering of Niobium DiselenideChemistry of Materials201729239907-9914
Prade, Friedrich.;Schaff, Florian.;Senck, Sascha.;Meyer, P.ascal;Mohr, Jürgen.;Kastner, Johann.;Pfeiffer, Franz.Nondestructive characterization of fiber orientation in short fiber reinforced polymer composites with X-ray vector radiographyNDT & E International20178665-72
Sharma, Yash.;Schaff, Florian.;Wieczorek, Matthias.;Pfeiffer, Franz.;Lasser, Tobias.Design of Acquisition Schemes and Setup Geometry for Anisotropic X-ray Dark-Field Tomography (AXDT)Scientific Reports201773195
Schwarz, Martin;Riss, Alexander;Garnica, Manuela;Ducke, Jacob;Deimel, Peter S.;Duncan, David A.;Thakur, Pardeep Kumar;Lee, Tien-Lin;Seitsonen, Ari Paavo;Barth, Johannes V.;Allegretti, Francesco;Auwärter, WilliCorrugation in the Weakly Interacting Hexagonal-BN/Cu(111) System: Structure Determination by Combining Noncontact Atomic Force Microscopy and X-ray Standing WavesACS Nano20171199151-9161
Papageorgiou, Anthoula C.;Diller, Katharina;Fischer, Sybille;Allegretti, Francesco;Klappenberger, Florian;Oh, Seung Cheol;Sağlam, Özge;Reichert, Joachim;Wiengarten, Alissa;Seufert, Knud;Auwärter, Willi;Barth, Johannes V.Correction to “In Vacuo Porphyrin Metalation on Ag(111) via Chemical Vapor Deposition of Ru3(CO)12: Mechanistic Insights”The Journal of Physical Chemistry C20171212212503-12503
Cirera, B.;Matarrubia, J.;Kaposi, T.;Giménez-Agulló, N.;Paszkiewicz, M.;Klappenberger, F.;Otero, R.;Gallego, J. M.;Ballester, P.;Barth, J. V.;Miranda, R.;Galán-Mascarós, J. R.;Auwärter, W.;Ecija, D.Preservation of electronic properties of double-decker complexes on metallic supportsPhysical Chemistry Chemical Physics201719128282-8287