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- Titel:
Digital CMOS Circuit Characterization in terms of Lifetime Reliability
- Autor(en):
- Aryan, Nasim Pour; Listl, Alexandra; Heiss, Leonhard; Yilmaz, Cenk; Georgakos, Georg; Schmitt-Landsiedel, Doris
- Kongress- / Buchtitel:
- WIP session, 51st Design Automation Conference (DAC)
- Jahr:
- 2014
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