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- Title:
A Compact Model for NBTI Degradation and Recovery under Use-Profile Variations and its Application to Aging Analysis of Digital Integrated Circuits
- Author(s):
- Kleeberger, Veit B.; Barke, Martin; Werner, Christoph; Schmitt-Landsiedel, Doris; Schlichtmann, Ulf
- Journal title:
- Microelectronics Reliability
- Year:
- 2014
- Journal volume:
- 54
- Month:
- June-July
- Journal issue:
- 6-7
- Pages contribution:
- 1083-1089
- Fulltext / DOI:
- doi:10.1016/j.microrel.2013.12.002
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