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- Titel:
Reliability monitoring of digital circuits by in situ timing measurement
- Autor(en):
- Pour Aryan, Nasim; Georgakos, Georg; Schmitt-Landsiedel, Doris
- Kongress- / Buchtitel:
- International Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS)
- Jahr:
- 2013
- Seiten:
- 150-156
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