Login
- Title:
Modeling of NBTI-recovery effects in analog CMOS circuits
- Author(s):
- Yilmaz, Cenk; Heiss, Leonhard; Werner, Christoph; Schmitt-Landsiedel, Doris
- Book / Congress title:
- IEEE International Reliability Physics Symposium (IRPS)
- Year:
- 2013
- Pages:
- 2A.4.1 - 2A.4.4
- Fulltext / DOI:
- doi:10.1109/IRPS.2013.6531944
BibTeX