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Author(s):
Yilmaz, Cenk; Heiss, Leonhard; Werner, Christoph; Schmitt-Landsiedel, Doris 
Title:
Modeling of NBTI-recovery effects in analog CMOS circuits 
Book / Congress title:
IEEE International Reliability Physics Symposium (IRPS) 
Year:
2013 
Pages:
2A.4.1 - 2A.4.4