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- Title:
DRAM Yield Analysis and Optimization by a Statistical Design Approach
- Author(s):
- Li, Yan; Schneider, H.; Schnabel, F.; Thewes, R.; Schmitt-Landsiedel, D.
- Journal title:
- IEEE Transactions on Circuit and Systems I: Regular Papers
- Year:
- 2011
- Journal volume:
- 58
- Journal issue:
- 12
- Pages contribution:
- 2906-2918
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