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- Title:
A method to analyze the impact of fast-recovering NBTI degradation on the stability of large-scale SRAM arrays
- Author(s):
- Drapatz, S.; Hofmann, K.; Georgakos, G.; Schmitt-Landsiedel, D.
- Book / Congress title:
- European Solid-State Device Research Conference (ESSDERC) / European Solid-State Circuits Converence (ESSCIRC)
- Volume:
- 65-66
- Year:
- 2011
- Pages:
- 191-196
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