Calculation of HEMT Oscillator Phase Noise Using Large Signal Analysis in Time Domain

A 15 GHz coplanar HEMT oscillator is analyzed in the time domain using a large signal transistor model for signal and noise analysis and phase noise calculation. The transistor model parameters in a wide bias range (200 bias points) are determined from DC, S-parameter and noise measurements, using cold and hot modelling techniques in combination with deembedding procedures. The model includes a low frequency fa noise source. Results of phase noise measurements are compared with calculated data and agree within ±5 dB     «

A 15 GHz coplanar HEMT oscillator is analyzed in the time domain using a large signal transistor model for signal and noise analysis and phase noise calculation. The transistor model parameters in a wide bias range (200 bias points) are determined from DC, S-parameter and noise measurements, using cold and hot modelling techniques in combination with deembedding procedures. The model includes a low frequency fa noise source. Results of phase noise measurements are compared with calculated data a...     »

15 GHz, cold modelling techniques, coplanar HEMT oscillator, DC measurements, deembedding procedures, equivalent circuits, HEMT oscillator, high electron mobility transistors, hot modelling techniques, large signal analysis, large signal transistor model, low frequency noise source, microwave integrated circuits, microwave oscillators, model parameters, noise measurements, nonlinear network analysis, phase noise, random noise, semiconductor device noise, SHF, S-parameter measurements, S-parameters, time domain analysis, time-domain analysis     «

15 GHz, cold modelling techniques, coplanar HEMT oscillator, DC measurements, deembedding procedures, equivalent circuits, HEMT oscillator, high electron mobility transistors, hot modelling techniques, large signal analysis, large signal transistor model, low frequency noise source, microwave integrated circuits, microwave oscillators, model parameters, noise measurements, nonlinear network analysis, phase noise, random noise, semiconductor device noise, SHF, S-parameter measurements, S-paramete...     »