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Title:

Measurement and VBIC Parameter Extraction of SiGe-Transistors

Author(s):
di Paola, A.; Olbrich, Gerhard R.
Book / Congress title:
11th Conference and Exhibition on Microwaves, Radio Communication and Electromagnetic Compatibility (MIOP)
Publisher address:
Stuttgart, Germany
Year:
2001
Month:
may
Pages:
260--262
 BibTeX