Measurement and VBIC Parameter Extraction of SiGe-Transistors

Title:: Measurement and VBIC Parameter Extraction of SiGe-Transistors
Author(s):: di Paola, A.; Olbrich, Gerhard R.
Book / Congress title:: 11th Conference and Exhibition on Microwaves, Radio Communication and Electromagnetic Compatibility (MIOP)
Publisher address:: Stuttgart, Germany
Year:: 2001
Month:: may
Pages:: 260--262
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