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- Title:
Reliability Assessment of Voltage Controlled Oscillators in 32nm High-k Metal Gate Technology
- Author(s):
- Chouard, Florian Raoul; Fulde, Michael; Schmitt-Landsiedel, Doris
- Pages contribution:
- 410-413
- Book / Congress title:
- European Solid-State Circuits Conference
- Year:
- 2010
- Month:
- sep
- Bookseries title:
- ESSCIRC Proceedings
- Fulltext / DOI:
- doi:10.1109/ESSCIRC.2010.5619730
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