User: Guest  Login
Document type:
Zeitschriftenaufsatz 
Author(s):
Mandeya, Richard; Chen, Cuili; Pickert, Volker; Naayagi, R. T.; Ji, Bing 
Title:
Gate–Emitter Pre-threshold Voltage as a Health-Sensitive Parameter for IGBT Chip Failure Monitoring in High-Voltage Multichip IGBT Power Modules 
Journal title:
IEEE Transactions on Power Electronics 
Year:
2019 
Journal volume:
34 
Journal issue:
Pages contribution:
9158-9169 
Publisher:
Institute of Electrical and Electronics Engineers (IEEE) 
E-ISSN:
0885-89931941-0107 
Date of publication:
01.09.2019