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Document type:
Konferenzbeitrag 
Author(s):
Rempe, A.-S.; Kindersberger, J.; Willner, E.-M.; Dietz, H. 
Title:
Determination of Interphase Thickness in Silicone Nanocomposites from Dielectric Properties 
Book / Congress title:
2020 IEEE 3rd International Conference on Dielectrics 
Congress (additional information):
Virtual Edition 
Organization:
Instituto de Tecnologia Electrica (ITE), Valencia, Spain 
Date of congress:
06.07.2020 - 31.07.2020 
Year:
2020 
Reviewed:
ja 
Language:
en 
TUM Institution:
HSA