- Author(s):
- Kehrle, Julian; Kaiser, Simon; Purkait, Tapas K.; Winnacker, Malte; Helbich, Tobias; Vagin, Sergei; Veinot, Jonathan G. C.; Rieger, Bernhard
- Title:
- In situ IR-spectroscopy as a tool for monitoring the radical hydrosilylation process on silicon nanocrystal surfaces
- Journal title:
- Nanoscale
- Year:
- 2017
- Journal volume:
- 9
- Journal issue:
- 24
- Pages contribution:
- 8489-8495
- Fulltext / DOI:
- doi:10.1039/c7nr02265d
- Publisher:
- Royal Society of Chemistry (RSC)
- E-ISSN:
- 2040-33642040-3372
- Date of publication:
- 01.01.2017
- BibTeX