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- Author(s):
- Habal, Husni; Graeb, Helmut
- Title:
- A Step-Accurate Model for the Trapping and Release of Charge Carriers Suitable for the Transient Simulation of Analog Circuits
- Journal title:
- Journal of Microelectronics Reliability
- Year:
- 2016
- Fulltext / DOI:
- doi:10.1016/j.microrel.2016.01.001
- Notes:
- Available online 26 January 2016, ISSN 0026-2714, http://dx.doi.org/10.1016/j.microrel.2016.01.001.
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