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Titel:

A Step-Accurate Model for the Trapping and Release of Charge Carriers Suitable for the Transient Simulation of Analog Circuits

Autor(en):
Habal, Husni; Graeb, Helmut
Zeitschriftentitel:
Journal of Microelectronics Reliability
Jahr:
2016
Volltext / DOI:
doi:10.1016/j.microrel.2016.01.001
Hinweise:
Available online 26 January 2016, ISSN 0026-2714, http://dx.doi.org/10.1016/j.microrel.2016.01.001.
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