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Titel:

The Dual-sided Effect of Project Failure on IT Professionals

Dokumenttyp:
Konferenzbeitrag
Autor(en):
Pflügler, Christoph; Wiesche, Manuel; Krcmar, Helmut
Abstract:
The effects of project failure on IT professionals have not received much attention in IT research. A failed project evokes negative emotions and therefore could trigger turnover, which has negative influences from the perspective of IT human resource management. However, the failure of IT projects could also have positive influences as professionals might learn from the failed project. This paper focuses on analyzing this dual-sided effect of project failure on IT professionals. We develop hypo...     »
Kongress- / Buchtitel:
ACM SIGMIS-CPR '16
Kongress / Zusatzinformationen:
Alexandria, Virginia, USA
Jahr:
2016
Leitbild:
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