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Title:

Fan-Out Wafer and Panel Level Packaging as Packaging Platform for Heterogeneous Integration.

Document type:
Journal Article
Author(s):
Braun, Tanja; Becker, Karl-Friedrich; Hoelck, Ole; Voges, Steve; Kahle, Ruben; Dreissigacker, Marc; Schneider-Ramelow, Martin
Abstract:
Fan-out wafer level packaging (FOWLP) is one of the latest packaging trends in microelectronics. Besides technology developments towards heterogeneous integration, including multiple die packaging, passive component integration in packages and redistribution layers or package-on-package approaches, larger substrate formats are also targeted. Manufacturing is currently done on a wafer level of up to 12"/300 mm and 330 mm respectively. For a higher productivity and, consequently, lower costs, larg...     »
Journal title abbreviation:
Micromachines (Basel)
Year:
2019
Journal volume:
10
Journal issue:
5
Fulltext / DOI:
doi:10.3390/mi10050342
Pubmed ID:
http://view.ncbi.nlm.nih.gov/pubmed/31126083
Print-ISSN:
2072-666X
TUM Institution:
Institut für Allgemeine Pathologie und Pathologische Anatomie
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