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- Title:
EffiTest: Efficient Delay Test and Statistical Prediction for Configuring Post-silicon Tunable Buffers (Best paper award nomination)
- Author(s):
- Zhang, Li; Li, Bing; Schlichtmann, Ulf
- Book / Congress title:
- ACM/IEEE Design Automation Conference (DAC)
- Year:
- 2016
- Month:
- jun
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