Login
- Titel:
EffiTest: Efficient Delay Test and Statistical Prediction for Configuring Post-silicon Tunable Buffers (Best paper award nomination)
- Autor(en):
- Zhang, Li; Li, Bing; Schlichtmann, Ulf
- Kongress- / Buchtitel:
- ACM/IEEE Design Automation Conference (DAC)
- Jahr:
- 2016
- Monat:
- jun
BibTeX