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- Author(s):
- Fischer, Thomas; Amirante, Ettore; Huber, Peter; Hofmann, Karl; Ostermayr, Martin; Schmitt-Landsiedel, Doris
- Title:
- A 65�nm test structure for SRAM device variability and NBTI statistics
- Keywords:
- Variability
- Congress title:
- Papers Selected from the 38th European Solid-State Device Research Conference - ESSDERC'08
- Journal title:
- Solid-State Electronics
- Year:
- 2009
- Journal volume:
- 53
- Journal issue:
- 7
- Pages contribution:
- 773 - 778
- Fulltext / DOI:
- doi:10.1016/j.sse.2009.02.012
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