- Autor(en):
- Baumann, T.; Schmitt-Landsiedel, D.; Pacha, C.
- Titel:
- Architectural Assessment of Design Techniques to Improve Speed and Robustness in Embedded Microprocessors
- Kongress- / Buchtitel:
- IEEE/ACM Design Automation Conference
- Jahr:
- 2009
- Monat:
- July
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