Spectral X-ray dark-field signal characterization from dual-energy projection phase-stepping data with a Talbot-Lau interferometer

Title:: Spectral X-ray dark-field signal characterization from dual-energy projection phase-stepping data with a Talbot-Lau interferometer
Document type:: Zeitschriftenaufsatz
Author(s):: Taphorn, Kirsten; Kaster, Lennard; Sellerer, Thorsten; Hötger, Alexander; Herzen, Julia
Journal title:: Scientific Reports
Year:: 2023
Journal volume:: 13
Journal issue:: 1
Fulltext / DOI:: doi:10.1038/s41598-022-27155-1
Publisher:: Springer Science and Business Media LLC
E-ISSN:: 2045-2322
Date of publication:: 14.01.2023
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