Spectral X-ray dark-field signal characterization from dual-energy projection phase-stepping data with a Talbot-Lau interferometer

Titel:: Spectral X-ray dark-field signal characterization from dual-energy projection phase-stepping data with a Talbot-Lau interferometer
Dokumenttyp:: Zeitschriftenaufsatz
Autor(en):: Taphorn, Kirsten; Kaster, Lennard; Sellerer, Thorsten; Hötger, Alexander; Herzen, Julia
Zeitschriftentitel:: Scientific Reports
Jahr:: 2023
Band / Volume:: 13
Heft / Issue:: 1
Volltext / DOI:: doi:10.1038/s41598-022-27155-1
Verlag / Institution:: Springer Science and Business Media LLC
E-ISSN:: 2045-2322
Publikationsdatum:: 14.01.2023
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