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Title:

Bit Error Rate Estimation Based on the Probabilistic Model of the Crosstalk Voltage

Document type:
Konferenzbeitrag
Author(s):
Kuznetsov, Y. V.; Baev, A. B.; Konovalyuk, M. A.; Gorbunova, A. A.; Russer, J. A.
Abstract:
The densely integrated electronic devices require ultra-low level of the bit error rate (BER). A huge number of the experiments provides BER estimation using statistical signal processing in multi-conductor transmission lines. In this paper the probabilistic model of the combined victim signal and crosstalk voltage is presented. The proposed approach allows to estimate statistical characteristics of different voltage trajectories of measured signals in the transmission lines. The experimental in...     »
Keywords:
stochastic processes, electromagnetic interference, time-domain analysis, electromagnetic compatibility, Bit Error Rate, crosstalk voltage
Book / Congress title:
2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE
Year:
2020
Month:
September
Pages:
1--6
Fulltext / DOI:
doi:10.1109/EMCEUROPE48519.2020.9245840
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