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Title:

Cyclostationary Characterization of Radiated Emissions in Digital Electronic Devices

Document type:
Zeitschriftenaufsatz
Author(s):
Kuznetsov, Y. V.; Baev, A. B.; Konovalyuk, M. A.; Gorbunova, A. A.; Russer, J. A.; Russer, P.
Abstract:
Stochastic electromagnetic fields originating from processes in digital circuitry affect the operation of the circuit, increase the error rate in the transmission of digital signals, degrade the circuit's performance, yield malfunction of the system or even lead to a complete failure of the system's operation. Interference from stochastic fields are not only disruptive but are becoming more common due to the increasing complexity of modern electronics. Stochastic electromagnetic fields under com...     »
Keywords:
Stochastic processes, electromagnetic interference, stochastic electromagnetic fields, Electromagnetic fields, Probes, Transmission line measurements, near-field scanning, Oscilloscopes, Crosstalk, Cyclostationarity, Random processes, spatial-time source localization
Journal title:
IEEE Electromagnetic Compatibility Magazine
Year:
2020
Journal volume:
9
Month:
December
Journal issue:
4
Pages contribution:
63--76
Fulltext / DOI:
doi:10.1109/MEMC.2020.9328001
Print-ISSN:
2162-2272
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