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Titel:

Bit Error Rate Estimation Based on the Probabilistic Model of the Crosstalk Voltage

Dokumenttyp:
Konferenzbeitrag
Art des Konferenzbeitrags:
Textbeitrag / Aufsatz
Autor(en):
Kuznetsov, Y.V.; Baev, A.B.; Konovalyuk, M.A.; Gorbunova, A.A.; Russer, J.A.
Abstract:
The densely integrated electronic devices require ultra-low level of the bit error rate (BER). A huge number of the experiments provides BER estimation using statistical signal processing in multi-conductor transmission lines. In this paper the probabilistic model of the combined victim signal and crosstalk voltage is presented. The proposed approach allows to estimate statistical characteristics of different voltage trajectories of measured signals in the transmission lines. The experimental in...     »
Stichworte:
stochastic processes , Bit Error Rate , crosstalk voltage , time-domain analysis , electromagnetic interference , electromagnetic compatibility
Kongress- / Buchtitel:
2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE
Kongress / Zusatzinformationen:
Rome, Italy, 23-25 Sept 2020 2020-09
Verlag / Institution:
IEEE Digital Explorer
Jahr:
2020
Quartal:
3. Quartal
Jahr / Monat:
2020-09
Monat:
Sep
Seiten:
1-6
Print-ISBN:
978-1-7281-5580-7
E-ISBN:
978-1-7281-5579-1; 978-1-7281-5578-4
Serien-ISSN:
2325-0364; 2325-0356
Sprache:
en
Volltext / DOI:
doi:10.1109/EMCEUROPE48519.2020.9245840
WWW:
https://ieeexplore.ieee.org/abstract/document/9245840
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