Klaß, Y.
Nanomechanical resonators from strongly stressed crystalline 3C SiC
3rd annual conference HOT-OMT Meeting, EU H2020 Hybrid Optomechanical Technologies, Optomechanical Technologies,
Gstad-Saanen, Switzerland, 20-23 Jan 2020-01
EPFL Lausanne, Switzerland
2020

Doster, J.; Hönl, S; Lorenz, H.; Paulitschke, P.; Weig, E.M.
Dynamics of coupled nanomechanical pillar resonators
OMT-HOT Annual Conference
Gstad-Saanen, Switzerland, 20-23 Jan 2020-01
EPFL Lausanne, Switzerland
2020

Stritt, P.; Doster, J.; Dekorsy, T.; Gusev, V.; Weig, E.M.; Hettich, M.
Looking Inside Micro- and Nano-Mechanical Pillar Resonators: A Picosecond Ultrasonics Approach
Proceedings of 4th International Conference nanoFIS - Functional Integrated nanoSystems, Proceedings 56, 31 2020-11
Volume Editors: Köck, A.;Deluca, M.
MDPI proceedings
2020

Gajo, K.; Rastelli, G.; Weig, E.M.
Tuning the nonlinear dispersive coupling of nanomechanical string resonators
PHYSICAL REVIEW B101, 075420 2020-02
2020
Feb

Huber, J.S.; Rastelli, G.; Seitner, M.J.; Kölbl, J.; Belzig, W.; Dykman, M.I.; Weig, E.M.
Spectral Evidence of Squeezing of a Weakly Damped Driven Nanomechanical Mode
Physical Review X 10, 021066 2020-06
2020
Jun

Doster, J.; Weig, E.M.
Pas de Deux in der Nanowelt
Physik in unserer Zeit, Treffpunkt Forschung, Volume 51, Issue 4, 2020-07
2020
Jul
165-166

Ashour, M.; Caspers, J.N.; Weig, E.M.; Degenfeld-Schonburg, P.
Spontaneous parametric down-conversion induced by optomechanical gradient forces in nanophotonic waveguides
arXiv:2002.04022v1 [physics.optics] 2020-02
2020
Feb

Bückle, M.; Klaß, Y.S.; Nägele, F.B.; Braive, R.; Weig, E.M.
Universal length dependence of tensile stress in nanomechanical string resonators
arXiv:2012.00507v1 [cond-mat.mes-hall] 2020-12
2020
Dec

Kuznetsov, Y.; Baev, A.; Konovalyuk, M.; Gorbunova, A.; Russer, J.A.
Poynting's Vector Modelling for Cyclostationary Electromagnetic Emissions from PCB
2020 Baltic URSI Symposium (URSI)
Warsaw, Poland, Poland 05-08 Oct 2020 (2020-10)
IEEE Digital Explorer
2020

Kuznetsov, Y.V.; Baev, A.B.; Konovalyuk, M.A.; Gorbunova, A.A.; Russer, J.A.
Bit Error Rate Estimation Based on the Probabilistic Model of the Crosstalk Voltage
2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE
Rome, Italy, 23-25 Sept 2020 2020-09
IEEE Digital Explorer
2020