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Title:

Bitline-capacitance-cancelation sensing scheme with 11ns read latency and maximum read throughput of 2.9GB/s in 65nm embedded flash for automotive

Document type:
Konferenzbeitrag
Contribution type:
Textbeitrag / Aufsatz
Author(s):
Jefremow, M.; Kern, T; Backhausen, U. und Peters, C.; Parzinger, C.; Roll, C.; Kassenetter, S.; Thierold, S.; Schmitt-Landsiedel, D.
Book / Congress title:
IEEE International Solid-State Circuits Conference Digest of Technical Papers (ISSCC)
Year:
2012
Pages:
428-430
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