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Title:

Optical measurement of nanomechanical motion with an imprecision at the standard quantum limit

Document type:
Konferenzbeitrag
Contribution type:
Textbeitrag / Aufsatz
Author(s):
Anetsberger, G.; Arcizet, O,; Gavartin, E.; Unterreithmeier, Q.P.; Weig, E.M.; Gorodetsky, M.L.; Kotthaus, J.P.; Kippenberg, T.J.
Abstract:
Ultra-high Q optical microresonators allow measuring nanomechanical motion with unprecedented sensitivity. For the first time, we reach a measurement imprecision at the standard quantum limit which has been a long sought-after goal for nanomechanical oscillators.
Keywords:
Motion measurement , Measurement standards , Optical sensors , Optical surface waves , Oscillators , Optical refraction , Optical variables control , Resonance , Microcavities , Silicon compounds
Book / Congress title:
CLEO/QELS: Laser Science to Photonic Applications
Congress (additional information):
San Jose CA USA, 16-21 May 2010-05
Publisher:
IEEE Digital Explorer
Year:
2010
Quarter:
2. Quartal
Year / month:
2010-05
Month:
May
E-ISBN:
CD:978-1-55752-890-2
Bookseries ISSN:
11411363
Language:
en
Fulltext / DOI:
doi:10.1364/CLEO.2010.JMA3
WWW:
https://ieeexplore.ieee.org/document/5499612/keywords#keywords
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