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Titel:

Signal-to-thickness calibration and pixel-wise interpolation for beam-hardening artefact reduction in microCT

Dokumenttyp:
Zeitschriftenaufsatz
Autor(en):
Gustschin, Nikolai; Gustschin, Alex; Epple, Michael; Allner, Sebastian; Achterhold, Klaus; Herzen, Julia; Pfeiffer, Franz
Abstract:
X-ray computed tomography (CT) reconstruction suffers from beam-hardening artefacts caused by the polychromaticity of virtually all lab-based X-ray sources. A method to correct for beam-hardening is a direct, pixel-wise signal-to-thickness calibration (STC). We compare reconstructions of conventionally flat-field corrected as well as STC preprocessed measurements of various samples performed on a commercial microCT device based on a flat-panel detector. We show that a good estimate between the t...     »
Zeitschriftentitel:
EPL (Europhysics Letters)
Jahr:
2019
Band / Volume:
125
Heft / Issue:
3
Seitenangaben Beitrag:
38003
Reviewed:
ja
Sprache:
en
Volltext / DOI:
doi:10.1209/0295-5075/125/38003
WWW:
https://iopscience.iop.org/article/10.1209/0295-5075/125/38003
Verlag / Institution:
IOP Publishing
E-ISSN:
1286-4854
Eingereicht (bei Zeitschrift):
15.11.2018
Angenommen (von Zeitschrift):
30.01.2019
Publikationsdatum:
07.03.2019
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