stochastic processes, time-domain analysis, signal processing, electromagnetic wave propagation, Surface impedance, Probes, Time-domain analysis, transient response, printed circuits, source signal, Transmission line measurements, near-field measurements, PCB, electric fields, statistical analysis, impulse response, near-field probe, linear transformation, near-field scanning system, Two dimensional displays, statistical signal processing, Mathematical model, Magnetic field measurement, 2D periodic ACF, computer aid prediction, cyclostationary characteristics, dipole radiation, electric field strength lines, far-field propagator modelling, initial random bit sequence properties, Jefimenko equations, Jefimenko's equations, linear-time invariant system, measurement procedure, near-field propagator modelling, radiated electromagnetic emissions, scanning point, spatial-time evolution, statistical characteristic estimation, synchronized impulse responses, time domain signals
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stochastic processes, time-domain analysis, signal processing, electromagnetic wave propagation, Surface impedance, Probes, Time-domain analysis, transient response, printed circuits, source signal, Transmission line measurements, near-field measurements, PCB, electric fields, statistical analysis, impulse response, near-field probe, linear transformation, near-field scanning system, Two dimensional displays, statistical signal processing, Mathematical model, Magnetic field measurement, 2D perio...
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