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- Document type:
- Zeitschriftenaufsatz
- Author(s):
- Dong, X.; Yetisen, A.K.; Tian, H.; Dong, J.; Köhler, M.H.; Jakobi, M.; Koch, A.W.
- Title:
- Analyses of hyperspectral imaging microscopy data sets of semiconducting 2D materials.
- Journal title:
- Applied Physics Express
- Year:
- 2020
- Journal volume:
- 13
- Journal issue:
- 052008
- Fulltext / DOI:
- doi:10.35848/1882-0786/ab88c7
- Date of publication:
- 23.04.2020
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