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Document type:
Zeitschriftenaufsatz
Author(s):
Prey, L.; Schmidhalter, U.
Title:
Deep Phenotyping of Yield-Related Traits in Wheat
Journal title:
Agronomy
Year:
2020
Journal volume:
10
Journal issue:
4
Pages contribution:
603
Language:
en
Fulltext / DOI:
doi:10.3390/agronomy10040603
Publisher:
MDPI AG
E-ISSN:
2073-4395
Date of publication:
23.04.2020
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