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Author(s):
Heiß, L.; Lachmann, A.; Schwab, R.; Panagopoulos, G.; Baumgartner, P.; Virupakshappaa, M. Y.; Schmitt-Landsiedel, D.
Title:
{T}est structures for {CMOS} {RF} reliability assessment
Keywords:
CMOS integrated circuits; high-k dielectric thin films; integrated circuit reliability; integrated circuit testing; oscilloscopes; radiofrequency integrated circuits; CMOS RF reliability assessment; HKMG technology; OCO; RF stress; high-k-metal-gate technology; on-chip AC stress circuits; on-chip oscilloscope; test structures; Clocks; Integrated circuit reliability; Radio frequency; Stress; Stress measurement; System-on-chip
Book / Congress title:
2016 International Conference on Microelectronic Test Structures (ICMTS)
Year:
2016
Month:
March
Pages:
76-81
Fulltext / DOI:
doi:10.1109/ICMTS.2016.7476178
BibTeX
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mediaTUM Gesamtbestand
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TUM School of Computation, Information and Technology
ehemalige Lehrstühle und Fachgebiete
Schaltungsentwurf (Prof. Brederlow)
2016
mediaTUM Gesamtbestand
Hochschulbibliographie
2016
Fakultäten
Elektrotechnik und Informationstechnik
Technische Elektronik (Prof. Schmitt-Landsiedel)