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- Titel:
From an Analytic NBTI Device Model to Reliability Assessment of Complex Digital Circuits
- Autor(en):
- Aryan, Nasim Pour; Listl, Alexandra; Heiss, Leonhard; Yilmaz, Cenk; Georgakos, Georg; Schmitt-Landsiedel, Doris
- Kongress- / Buchtitel:
- 20th IEEE International On-Line Testing Symposium (IOLTS)
- Jahr:
- 2014
- Seiten:
- 19--24
- Volltext / DOI:
- doi:10.1109/IOLTS.2014.6873666
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