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- Title:
Impact and measurement of short term threshold instabilities in MOSFETs of analog circuits
- Document type:
- Konferenzbeitrag
- Contribution type:
- Textbeitrag / Aufsatz
- Author(s):
- Rott, K.; Schmitt-Landsiedel, D.; Reisinger, H.; Rott, G.; Schlünder, G. GeoG. Georgakos.; Aresu, S.; Grasser, T.
- Book / Congress title:
- International Integrated Reliability Workshop
- Year:
- 2012
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