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- Title:
DRAM Yield Analysis and Optimization by a Statistical Design Approach
- Author(s):
- Yan Li, Helmut Schneider, Florian Schnabel, Roland Thewes; Schmitt-Landsiedel, Doris
- Journal title:
- IEEE_J_CASI_RP
- Year:
- 2011
- Journal volume:
- 58
- Month:
- dec
- Journal issue:
- 12
- Pages contribution:
- 2906-2918
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