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- Title:
An analog perspective on device reliability in 32nm high-k metal gate technology
- Author(s):
- Chouard, F; More, S.; Fulde, M.; Schmitt-Landsiedel, D.
- Book / Congress title:
- IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)
- Year:
- 2011
- Pages:
- 65-70
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