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- Titel:
An analog perspective on device reliability in 32nm high-k metal gate technology
- Autor(en):
- Chouard, F; More, S.; Fulde, M.; Schmitt-Landsiedel, D.
- Kongress- / Buchtitel:
- IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)
- Jahr:
- 2011
- Seiten:
- 65-70
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